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Intellectual Property Analysis Specialist, Expert Witness and Forensic Consultant.

Experience in microanalysis of small particles related to contamination control, process monitoring, source identification,and environmental monitoring.

EXPERT ID: 13836

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Location:  US

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ADDITIONAL INFORMATION

 

Short Biography:

EDUCATION:

M.B.A., Emory University, 1989.

Ph.D., Geophysical Sciences, The University of Chicago, 1983.

M.S., Oceanography, Florida State University, 1978.

B.S., Education, The University of North Carolina at Chapel Hill, 1974.

PUBLICATIONS AND PRESENTATIONS:

Over fifty publications and presentations on topics ranging from air pollution studies, through contaminant identification to fundamental issues of analysis theory. Presentations include those given at meetings of the National Asbestos Council, The American Association of Aerosol Research, The National Technical University, International Business Machines, The Microcontamination Conference, The Microbeam Analysis Society and The Microscopy Society of America.

OTHER:

Past member of the Board of Editorial Advisors: "Microcontamination".

Session chair for the International Symposium on Contamination Control, The Microcontamination Conference, The American Association for Aerosol Research, The Materials Society.

Provided tutorials on small particle analysis for IBM, the National Technical University, The Fine Particle Society and the Department of the Air Force.

Plenary lecturer for the American Association of Aerosol Research national meeting, 1988.

Adjunct Professor, Florida A & M University, 2000-2001.

Beta Gamma Sigma Scholar, Emory University, 1988.

Guest Editor, "Solid State Technology", April, 1985.

Salisbury Fellow, The University of Chicago, 1978.


 

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Some of the Keywords entered by this Expert:

Stack Testing Light Microscopy Materials Characterization Product Liability Microanalysis
Toxic Torts Microanalysis Microanalysis Microanalysis Electron Microscopy
Intellectual Property Materials Characterization Plm Materials Characterization Patent Infringement


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